Zolotoyabko, Emil creator author gw 2014 eng xii, 297 pages : illustrations (some color) ; 25 cm. "Authored by a university professor deeply involved in X-ray diffraction-related research, this textbook is based on his lectures given to graduate students for more than 20 years. It adopts a well-balanced approach, describing basic concepts and experimental techniques, which make X-ray diffraction an unsurpassed method for studying the structure of materials. Both dynamical and kinematic X-ray diffraction is considered from a unified viewpoint, in which the dynamical diffraction in single-scattering approximation serves as a bridge between these two parts. The text emphasizes the fundamental laws that govern the interaction of X-rays with matter, but also covers in detail classical and modern applications..."-- Back cover. Preface -- Introduction -- Diffraction phenomena in optics -- Wave propagation in periodic media -- Dynamical diffraction of particles and fields: general considerations -- Dynamical x-ray diffraction: the Ewald-Laue approach -- Dynamical diffraction: the Darwin approach -- Dynamical diffraction in nonhomogeneous media: the Takagi-Taupin approach -- X-ray absorption -- Dynamical diffraction in single-scattering approximation: simulation of high-resolution x-ray diffraction in heterostructures and multilayers -- Reciprocal space mapping and strain measurements in heterostructures -- X-ray diffraction in kinematic approximation -- X-ray diffraction from polycrystalline materials -- Applications to materials science: structure analysis -- Applications to materials science: phase analysis -- Applications to materials science: preferred orientation (texture) analysis -- Applications to materials science: line broadening analysis -- Applications to materials science: residual strain/stress measurements -- Impact of lattice defects on x-ray diffraction -- X-ray diffraction measurements in polycrystals with high spatial resolution -- Inelastic scattering -- Interaction of x-rays with acoustic waves -- Time-resolved x-ray diffraction -- X-ray sources -- X-ray focusing optics -- X-ray diffractometers -- References -- Index. Emil Zolotoyabko Includes bibliographical references (pages 285-290) and index. X-rays Diffraction QC482.D5 9783527335619 (paperback) 3527335617 (paperback) UIAM 150428 20230520035415.0 868084035 eng