Walkosz, Weronika, <br/><br/>
Atomic scale characterization and first-principles studies of Si3N4 interfaces / 
Weronika Walkosz 
 - 1 online resource (xiii, 108 pages) :  illustrations (some color), charts 
 - Springer theses : recognizing outstanding Ph.D. research,  2190-5053 .
<br/><br/> "Doctoral thesis accepted by the University of Illinois - Chicago, Chicago, USA." 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>9781441978165 (hardback) 144197816X 
<br/><br/><label>LCCN: </label>2012518419 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Interfaces (Physical sciences)<br/>Condensed matter
<br/><br/><label>LC Class. No.: </label>QC173.4.I57