01349cam a2200373 i 4500 17553140 20220608112832.0 cr mn nnnaucua 220608t2011 nyua gob 001 0 eng 2012518419 9781441978165 (hardback) 144197816X 9781441978172 (ebook) 1441978178 (ebook) DLC eng rda DLC DLC UIAM QC173.4.I57 Walkosz, Weronika, author 2377 Atomic scale characterization and first-principles studies of Si3N4 interfaces / Weronika Walkosz New York : Springer, 2011 ©2011 1 online resource (xiii, 108 pages) : illustrations (some color), charts text rdacontent unmediated rdamedia volume rdacarrier text file PDF rda Springer theses : recognizing outstanding Ph.D. research, 2190-5053 "Doctoral thesis accepted by the University of Illinois - Chicago, Chicago, USA." Includes bibliographical references and index. Interfaces (Physical sciences) 2378 Condensed matter 2379 http://link.springer.com/10.1007/978-1-4419-7817-2 bib-nhe lcc EBOOK 502226 533643 0 0 lcc 0 0 EBOOK IIUM IIUM WEB 2022-06-08 0 eb QC 173.4 I57 W186A 2011 11100444460 2022-06-08 00:00:00 2022-06-08 EBOOK