Materials and reliability handbook for semiconductor optical and electron devices /
Semiconductor optical and electron devices
Osamu Ueda, Stephen J. Pearton, editors
- 1 online resource (xv, 616 pages) : illustrations (some color)
Includes bibliographical references and index.
Materials issues and reliability of optical devices: Reliability testing of semiconductor optical devices / Failure analysis of semiconductor optical devices / Failure analysis using optical evaluation technique (OBIC) of LDs and APDs for fiber optical communication / Reliability and degradation of III-V optical devices focusing on gradual degradation / Catastrophic optical damage in high-power, broad-area laser diodes / Reliability and degradation of vertical-cavity surface-emitting lasers / Structural defects in GaN-based materials and their relation to GaN-based laser diodes / InGaN laser diode degradation / Radiation-enhanced dislocation glide : the current status of research / Mechanism of defect reactions in semiconductors / Materials issues and reliability of electron devices: Reliability studies in the real world / Strain effects in AlGaN/GaN HEMTs / Reliability issues in AlGaN/GaN high electron mobility transistors / GaAs device reliability : high electron mobility transistors and heterojunction bipolar transistors / Novel dielectrics for GaN device passivation and improved reliability / Reliability simulation / The analysis of wide band gap semiconductors using Raman spectroscopy / Reliability study of InP-based HBTs operating at high current density / Mitsuo Fukuda. Osamu Ueda and Robert W. Herrick. Tatsuya Takeshita. Osamu Ueda. Aland K. Chin and Rick K. Bertaska. Robert W. Herrick. Shigetaka Tomiya. Piotr Perlin and ucja Marona. Koji Maeda. Yuzo Shinozuka -- William J. Roesch. Min Chu, Andrew D. Koehler, Amit Gupta, Srivatsan Parthasarathy and Mehmet Onur Baykan, et al. E.A. Douglas, L. Liu, C.F. Lo, B.P. Gila and F. Ren, et al. F. Ren, E.A. Douglas and Stephen J. Pearton. F. Ren, Stephen J. Pearton, B.P. Gila, C.R. Abernathy and R.C. Fitch. M.E. Law, M. Griglione, E. Patrick, N. Rowsey and D. Horton. Sukwon Choi, Eric Heller, Don Dorsey and Samuel Graham. Yoshino K. Fukai and Kenji Kurishima.