03758cam a2200481 i 4500 17434001 UIAM 20260313110103.0 cr mn#nnnaucua 120817t2012 nyua gob 001 0 eng c 2012947361 9781461443360 (hardback) 1461443369 (hardback) 9781461443377 (ebook) 1461443377 (ebook) (OCoLC)ocn793572160 BTCTA eng BTCTA YDXCP BWX IQU ZWZ OCLCF OCLCQ OCLCO DLC UIAM rda TK7871.85 Ueda, Osamu, author editor 606960 Materials and reliability handbook for semiconductor optical and electron devices / Osamu Ueda, Stephen J. Pearton, editors Semiconductor optical and electron devices New York : Springer, 2013 ©2013 1 online resource (xv, 616 pages) : illustrations (some color) text rdacontent computer rdamedia online resource rdacarrier text file PDF rda Includes bibliographical references and index. Materials issues and reliability of optical devices: Reliability testing of semiconductor optical devices / Mitsuo Fukuda. Failure analysis of semiconductor optical devices / Osamu Ueda and Robert W. Herrick. Failure analysis using optical evaluation technique (OBIC) of LDs and APDs for fiber optical communication / Tatsuya Takeshita. Reliability and degradation of III-V optical devices focusing on gradual degradation / Osamu Ueda. Catastrophic optical damage in high-power, broad-area laser diodes / Aland K. Chin and Rick K. Bertaska. Reliability and degradation of vertical-cavity surface-emitting lasers / Robert W. Herrick. Structural defects in GaN-based materials and their relation to GaN-based laser diodes / Shigetaka Tomiya. InGaN laser diode degradation / Piotr Perlin and ucja Marona. Radiation-enhanced dislocation glide : the current status of research / Koji Maeda. Mechanism of defect reactions in semiconductors / Yuzo Shinozuka -- Materials issues and reliability of electron devices: Reliability studies in the real world / William J. Roesch. Strain effects in AlGaN/GaN HEMTs / Min Chu, Andrew D. Koehler, Amit Gupta, Srivatsan Parthasarathy and Mehmet Onur Baykan, et al. Reliability issues in AlGaN/GaN high electron mobility transistors / E.A. Douglas, L. Liu, C.F. Lo, B.P. Gila and F. Ren, et al. GaAs device reliability : high electron mobility transistors and heterojunction bipolar transistors / F. Ren, E.A. Douglas and Stephen J. Pearton. Novel dielectrics for GaN device passivation and improved reliability / F. Ren, Stephen J. Pearton, B.P. Gila, C.R. Abernathy and R.C. Fitch. Reliability simulation / M.E. Law, M. Griglione, E. Patrick, N. Rowsey and D. Horton. The analysis of wide band gap semiconductors using Raman spectroscopy / Sukwon Choi, Eric Heller, Don Dorsey and Samuel Graham. Reliability study of InP-based HBTs operating at high current density / Yoshino K. Fukai and Kenji Kurishima. Semiconductors Materials 15510 Semiconductors Reliability 183486 Optoelectronic devices Materials 416222 Optoelectronic devices Reliability Electronic apparatus and appliances Materials 450641 Electronic apparatus and appliances Reliability 273611 Optical materials 10337 Electronic books (Form) 217 Pearton, S. J., editor 165162 https://link.springer.com/book/10.1007/978-1-4614-4337-7 lcc EBOOK 0 531383 562800 0 0 lcc 0 19 EBOOK IIUM IIUM WEB 2025-05-21 0 eb TK 7871.85 U22M 2013 11100465711 2025-05-21 00:00:00 2025-05-21 EBOOK