Ueda, Osamu creator author editor Pearton, S. J. editor text bibliography Electronic books (Form) nyu 2012 monographic eng access 1 online resource (xv, 616 pages) : illustrations (some color) Materials issues and reliability of optical devices: Reliability testing of semiconductor optical devices / Mitsuo Fukuda. Failure analysis of semiconductor optical devices / Osamu Ueda and Robert W. Herrick. Failure analysis using optical evaluation technique (OBIC) of LDs and APDs for fiber optical communication / Tatsuya Takeshita. Reliability and degradation of III-V optical devices focusing on gradual degradation / Osamu Ueda. Catastrophic optical damage in high-power, broad-area laser diodes / Aland K. Chin and Rick K. Bertaska. Reliability and degradation of vertical-cavity surface-emitting lasers / Robert W. Herrick. Structural defects in GaN-based materials and their relation to GaN-based laser diodes / Shigetaka Tomiya. InGaN laser diode degradation / Piotr Perlin and ucja Marona. Radiation-enhanced dislocation glide : the current status of research / Koji Maeda. Mechanism of defect reactions in semiconductors / Yuzo Shinozuka -- Materials issues and reliability of electron devices: Reliability studies in the real world / William J. Roesch. Strain effects in AlGaN/GaN HEMTs / Min Chu, Andrew D. Koehler, Amit Gupta, Srivatsan Parthasarathy and Mehmet Onur Baykan, et al. Reliability issues in AlGaN/GaN high electron mobility transistors / E.A. Douglas, L. Liu, C.F. Lo, B.P. Gila and F. Ren, et al. GaAs device reliability : high electron mobility transistors and heterojunction bipolar transistors / F. Ren, E.A. Douglas and Stephen J. Pearton. Novel dielectrics for GaN device passivation and improved reliability / F. Ren, Stephen J. Pearton, B.P. Gila, C.R. Abernathy and R.C. Fitch. Reliability simulation / M.E. Law, M. Griglione, E. Patrick, N. Rowsey and D. Horton. The analysis of wide band gap semiconductors using Raman spectroscopy / Sukwon Choi, Eric Heller, Don Dorsey and Samuel Graham. Reliability study of InP-based HBTs operating at high current density / Yoshino K. Fukai and Kenji Kurishima. general Osamu Ueda, Stephen J. Pearton, editors Includes bibliographical references and index. Semiconductors Materials Semiconductors Reliability Optoelectronic devices Materials Optoelectronic devices Reliability Electronic apparatus and appliances Materials Electronic apparatus and appliances Reliability Optical materials TK7871.85 9781461443360 (hardback) 1461443369 (hardback) 9781461443377 (ebook) 1461443377 (ebook) 2012947361 https://link.springer.com/book/10.1007/978-1-4614-4337-7 https://link.springer.com/book/10.1007/978-1-4614-4337-7 BTCTA 120817 20260313110103.0 17434001 eng