Atomic scale characterization and first-principles studies of Si3N4 interfaces / Weronika Walkosz
Series: Springer theses : recognizing outstanding Ph.D. researchPublisher: New York : Springer, 2011Copyright date: ©2011Description: 1 online resource (xiii, 108 pages) : illustrations (some color), chartsContent type:- text
- unmediated
- volume
- 9781441978165 (hardback)
- 144197816X
- QC173.4.I57
| Cover image | Item type | Current library | Home library | Collection | Shelving location | Call number | Materials specified | Vol info | URL | Copy number | Status | Notes | Date due | Barcode | Item holds | Item hold queue priority | Course reserves | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| e-Book | M. Kamal Hassan Library | M. Kamal Hassan Library | E-Book Collection | Web | eb QC 173.4 I57 W186A 2011 (Browse shelf(Opens below)) | Not for loan | 11100444460 |
"Doctoral thesis accepted by the University of Illinois - Chicago, Chicago, USA."
Includes bibliographical references and index.