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Results of search for 'an:273611'
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Chan, H. Anthony
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Englert, Paul J.
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Pearton, S. J.
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Pecht, Judy
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Long-term non-operating reliability of electronic products /
Judy Pecht, Michael Pecht
by
Pecht, Judy
Pecht, Michael
Publication details:
Boca Raton, Florida
: CRC Press,
1995
Availability:
Items available for loan:
M. Kamal Hassan Library
(1)
Location, call number:
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TK7870P364L 1995
.
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Accelerated stress testing handbook : guide for achieving quality products /
edited by H. Anthony Chan, Paul J. Englert
by
Chan, H. Anthony
, 1952-
Englert, Paul J
, 1960-
Publication details:
New York :
IEEE Press,
2001
Availability:
Items available for loan:
M. Kamal Hassan Library
(1)
Location, call number:
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TK7870.23A169C 2001
.
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Materials and reliability handbook for semiconductor optical and electron devices /
Osamu Ueda, Stephen J. Pearton, editors
by
Ueda, Osamu
[author, editor]
Pearton, S. J
[editor]
Publisher:
New York :
Springer,
2013
Copyright date:
©2013
Other title:
Semiconductor optical and electron devices
Online resources:
Click here to access online
Availability:
Not available:
M. Kamal Hassan Library: Online Access
(1).
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