Includes bibliographical references and index.

Materials issues and reliability of optical devices: Reliability testing of semiconductor optical devices / Mitsuo Fukuda. Failure analysis of semiconductor optical devices / Osamu Ueda and Robert W. Herrick. Failure analysis using optical evaluation technique (OBIC) of LDs and APDs for fiber optical communication / Tatsuya Takeshita. Reliability and degradation of III-V optical devices focusing on gradual degradation / Osamu Ueda. Catastrophic optical damage in high-power, broad-area laser diodes / Aland K. Chin and Rick K. Bertaska. Reliability and degradation of vertical-cavity surface-emitting lasers / Robert W. Herrick. Structural defects in GaN-based materials and their relation to GaN-based laser diodes / Shigetaka Tomiya. InGaN laser diode degradation / Piotr Perlin and ucja Marona. Radiation-enhanced dislocation glide : the current status of research / Koji Maeda. Mechanism of defect reactions in semiconductors / Yuzo Shinozuka -- Materials issues and reliability of electron devices: Reliability studies in the real world / William J. Roesch. Strain effects in AlGaN/GaN HEMTs / Min Chu, Andrew D. Koehler, Amit Gupta, Srivatsan Parthasarathy and Mehmet Onur Baykan, et al. Reliability issues in AlGaN/GaN high electron mobility transistors / E.A. Douglas, L. Liu, C.F. Lo, B.P. Gila and F. Ren, et al. GaAs device reliability : high electron mobility transistors and heterojunction bipolar transistors / F. Ren, E.A. Douglas and Stephen J. Pearton. Novel dielectrics for GaN device passivation and improved reliability / F. Ren, Stephen J. Pearton, B.P. Gila, C.R. Abernathy and R.C. Fitch. Reliability simulation / M.E. Law, M. Griglione, E. Patrick, N. Rowsey and D. Horton. The analysis of wide band gap semiconductors using Raman spectroscopy / Sukwon Choi, Eric Heller, Don Dorsey and Samuel Graham. Reliability study of InP-based HBTs operating at high current density / Yoshino K. Fukai and Kenji Kurishima.